With emphasis on practical aspects of engineering, this bestseller has gained worldwide recognition through progressive editions as the essential reliability textbook. This fifth edition retains the unique balanced mixture of reliability theory and applications, thoroughly updated with the latest industry best practices. Practical Reliability Engineering fulfils the requirements of the Certified Reliability Engineer curriculum of the American Society for Quality (ASQ). Each chapter is supported by practice questions, and a solutions manual is available to course tutors via the companion website. Enhanced coverage of mathematics of reliability, physics of failure, graphical and software methods of failure data analysis, reliability prediction and modelling, design for reliability and safety as well as management and economics of reliability programmes ensures continued relevance to all quality assurance and reliability courses. Notable additions include: New chapters on applications of Monte Carlo simulation methods and reliability demonstration methods. Software applications of statistical methods, including probability plotting and a wider use of common software tools. More detailed descriptions of reliability prediction methods. Comprehensive treatment of accelerated test data analysis and warranty data analysis. Revised and expanded end-of-chapter tutorial sections to advance students’ practical knowledge. The fifth edition will appeal to a wide range of readers from college students to seasoned engineering professionals involved in the design, development, manufacture and maintenance of reliable engineering products and systems. www.wiley.com/go/oconnor_reliability5
This book presents fundamentals of reliability engineering with its applications in evaluating reliability of multistage interconnection networks. In the first part of the book, it introduces the concept of reliability engineering, elements of probability theory, probability distributions, availability and data analysis. The second part of the book provides an overview of parallel/distributed computing, network design considerations, and more. The book covers a comprehensive reliability engineering methods and its practical aspects in the interconnection network systems. Students, engineers, researchers, managers will find this book as a valuable reference source.
A newly revised and updated edition that details both the theoretical foundations and practical applications of reliability engineering Reliability is one of the most important quality characteristics of components, products, and large and complex systems—but it takes a significant amount of time and resources to bring reliability to fruition. Thoroughly classroom- and industry-tested, this book helps ensure that engineers see reliability success with every product they design, test, and manufacture. Divided into three parts, Reliability Engineering, Second Edition handily describes the theories and their practical uses while presenting readers with real-world examples and problems to solve. Part I focuses on system reliability estimation for time independent and failure dependent models, helping engineers create a reliable design. Part II aids the reader in assembling necessary components and configuring them to achieve desired reliability objectives, conducting reliability tests on components, and using field data from similar components. Part III follows what happens once a product is produced and sold, how the manufacturer must ensure its reliability objectives by providing preventive and scheduled maintenance and warranty policies. This Second Edition includes in-depth and enhanced chapter coverage of: Reliability and Hazard Functions System Reliability Evaluation Time- and Failure-Dependent Reliability Estimation Methods of the Parameters of Failure-Time Distributions Parametric Reliability Models Models for Accelerated Life Testing Renewal Processes and Expected Number of Failures Preventive Maintenance and Inspection Warranty Models Case Studies A comprehensive reference for practitioners and professionals in quality and reliability engineering, Reliability Engineering can also be used for senior undergraduate or graduate courses in industrial and systems, mechanical, and electrical engineering programs.
Practical tools for analyzing, calculating, and reporting availability, reliability, and maintainability metrics Engineers in the telecommunications industry must be able to quantify system reliability and availability metrics for use in service level agreements, system design decisions, and daily operations. Increasing system complexity and software dependence require new, more sophisticated tools for system modeling and metric calculation than those available in the current literature. Telecommunications System Reliability Engineering, Theory, and Practice provides a background in reliability engineering theory as well as detailed sections discussing applications to fiber optic networks (earth station and space segment), microwave networks (long-haul, cellular backhaul and mobile wireless), satellite networks (teleport and VSAT), power systems (generators, commercial power and battery systems), facilities management, and software/firmware. Programming techniques and examples for simulation of the approaches presented are discussed throughout the book. This powerful resource: Acts as a comprehensive reference and textbook for analysis and design of highly reliable and available telecommunications systems Bridges the fields of system reliability theory, telecommunications system engineering, and computer programming Translates abstract reliability theory concepts into practical tools and techniques for technical managers, engineers and students Provides telecommunication engineers with a holistic understanding of system reliability theory, telecommunications system engineering, and reliability/risk analysis Telecommunications System Reliability Engineering, Theory, and Practice is a must-have guide for telecommunications engineers or engineering students planning to work in the field of telecommunications Telecommunications System Reliability Engineering, Theory, and Practice is a must-have guide for telecommunications engineers or engineering students planning to work in the field of telecommunications.
A unique, design-based approach to reliability engineering Design for Reliability provides engineers and managers with a range of tools and techniques for incorporating reliability into the design process for complex systems. It clearly explains how to design for zero failure of critical system functions, leading to enormous savings in product life-cycle costs and a dramatic improvement in the ability to compete in global markets. Readers will find a wealth of design practices not covered in typical engineering books, allowing them to think outside the box when developing reliability requirements. They will learn to address high failure rates associated with systems that are not properly designed for reliability, avoiding expensive and time-consuming engineering changes, such as excessive testing, repairs, maintenance, inspection, and logistics. Special features of this book include: A unified approach that integrates ideas from computer science and reliability engineering Techniques applicable to reliability as well as safety, maintainability, system integration, and logistic engineering Chapters on design for extreme environments, developing reliable software, design for trustworthiness, and HALT influence on design Design for Reliability is a must-have guide for engineers and managers in R&D, product development, reliability engineering, product safety, and quality assurance, as well as anyone who needs to deliver high product performance at a lower cost while minimizing system failure.
Practical Approaches to Reliability Theory in Cutting-Edge Applications Probabilistic Reliability Models helps readers understand and properly use statistical methods and optimal resource allocation to solve engineering problems. The author supplies engineers with a deeper understanding of mathematical models while also equipping mathematically oriented readers with a fundamental knowledge of the engineeringrelated applications at the center of model building. The book showcases the use of probability theory and mathematical statistics to solve common, real-world reliability problems. Following an introduction to the topic, subsequent chapters explore key systems and models including: • Unrecoverable objects and recoverable systems • Methods of direct enumeration • Markov models and heuristic models • Performance effectiveness • Time redundancy • System survivability • Aging units and their related systems • Multistate systems Detailed case studies illustrate the relevance of the discussed methods to real-world technical projects including software failure avalanches, gas pipelines with underground storage, and intercontinental ballistic missile (ICBM) control systems. Numerical examples and detailed explanations accompany each topic, and exercises throughout allow readers to test their comprehension of the presented material. Probabilistic Reliability Models is an excellent book for statistics, engineering, and operations research courses on applied probability at the upper-undergraduate and graduate levels. The book is also a valuable reference for professionals and researchers working in industry who would like a mathematical review of reliability models and the relevant applications.
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
A comprehensively updated and reorganized new edition. The updates include comparative methods for improving reliability; methods for optimal allocation of limited resources to achieve a maximum risk reduction; methods for improving reliability at no extra cost and building reliability networks for engineering systems. Includes: A unique set of 46 generic principles for reducing technical risk Monte Carlo simulation algorithms for improving reliability and reducing risk Methods for setting reliability requirements based on the cost of failure New reliability measures based on a minimal separation of random events on a time interval Overstress reliability integral for determining the time to failure caused by overstress failure modes A powerful equation for determining the probability of failure controlled by defects in loaded components with complex shape Comparative methods for improving reliability which do not require reliability data Optimal allocation of limited resources to achieve a maximum risk reduction Improving system reliability based solely on a permutation of interchangeable components
Rockfall Engineering is an up-to-date, international picture of the state of the art in rockfall engineering. The three basic stages of rockfalls are considered: the triggering stage, the motion stage, and the interaction with a structure stage; along with contributions including structural characterization of cliffs, remote monitoring, stability analysis, boulder propagation, design of protection structures an risk assessment. Academic contributions are illustrated by practical examples, and completed by engineering contributions where practical purposes are thoroughly considered. This title is intended for engineers, students as well as researchers.