A unique, design-based approach to reliability engineering Design for Reliability provides engineers and managers with a range of tools and techniques for incorporating reliability into the design process for complex systems. It clearly explains how to design for zero failure of critical system functions, leading to enormous savings in product life-cycle costs and a dramatic improvement in the ability to compete in global markets. Readers will find a wealth of design practices not covered in typical engineering books, allowing them to think outside the box when developing reliability requirements. They will learn to address high failure rates associated with systems that are not properly designed for reliability, avoiding expensive and time-consuming engineering changes, such as excessive testing, repairs, maintenance, inspection, and logistics. Special features of this book include: A unified approach that integrates ideas from computer science and reliability engineering Techniques applicable to reliability as well as safety, maintainability, system integration, and logistic engineering Chapters on design for extreme environments, developing reliable software, design for trustworthiness, and HALT influence on design Design for Reliability is a must-have guide for engineers and managers in R&D, product development, reliability engineering, product safety, and quality assurance, as well as anyone who needs to deliver high product performance at a lower cost while minimizing system failure.
With emphasis on practical aspects of engineering, this bestseller has gained worldwide recognition through progressive editions as the essential reliability textbook. This fifth edition retains the unique balanced mixture of reliability theory and applications, thoroughly updated with the latest industry best practices. Practical Reliability Engineering fulfils the requirements of the Certified Reliability Engineer curriculum of the American Society for Quality (ASQ). Each chapter is supported by practice questions, and a solutions manual is available to course tutors via the companion website. Enhanced coverage of mathematics of reliability, physics of failure, graphical and software methods of failure data analysis, reliability prediction and modelling, design for reliability and safety as well as management and economics of reliability programmes ensures continued relevance to all quality assurance and reliability courses. Notable additions include: New chapters on applications of Monte Carlo simulation methods and reliability demonstration methods. Software applications of statistical methods, including probability plotting and a wider use of common software tools. More detailed descriptions of reliability prediction methods. Comprehensive treatment of accelerated test data analysis and warranty data analysis. Revised and expanded end-of-chapter tutorial sections to advance students’ practical knowledge. The fifth edition will appeal to a wide range of readers from college students to seasoned engineering professionals involved in the design, development, manufacture and maintenance of reliable engineering products and systems. www.wiley.com/go/oconnor_reliability5
A newly revised and updated edition that details both the theoretical foundations and practical applications of reliability engineering Reliability is one of the most important quality characteristics of components, products, and large and complex systems—but it takes a significant amount of time and resources to bring reliability to fruition. Thoroughly classroom- and industry-tested, this book helps ensure that engineers see reliability success with every product they design, test, and manufacture. Divided into three parts, Reliability Engineering, Second Edition handily describes the theories and their practical uses while presenting readers with real-world examples and problems to solve. Part I focuses on system reliability estimation for time independent and failure dependent models, helping engineers create a reliable design. Part II aids the reader in assembling necessary components and configuring them to achieve desired reliability objectives, conducting reliability tests on components, and using field data from similar components. Part III follows what happens once a product is produced and sold, how the manufacturer must ensure its reliability objectives by providing preventive and scheduled maintenance and warranty policies. This Second Edition includes in-depth and enhanced chapter coverage of: Reliability and Hazard Functions System Reliability Evaluation Time- and Failure-Dependent Reliability Estimation Methods of the Parameters of Failure-Time Distributions Parametric Reliability Models Models for Accelerated Life Testing Renewal Processes and Expected Number of Failures Preventive Maintenance and Inspection Warranty Models Case Studies A comprehensive reference for practitioners and professionals in quality and reliability engineering, Reliability Engineering can also be used for senior undergraduate or graduate courses in industrial and systems, mechanical, and electrical engineering programs.
Practical tools for analyzing, calculating, and reporting availability, reliability, and maintainability metrics Engineers in the telecommunications industry must be able to quantify system reliability and availability metrics for use in service level agreements, system design decisions, and daily operations. Increasing system complexity and software dependence require new, more sophisticated tools for system modeling and metric calculation than those available in the current literature. Telecommunications System Reliability Engineering, Theory, and Practice provides a background in reliability engineering theory as well as detailed sections discussing applications to fiber optic networks (earth station and space segment), microwave networks (long-haul, cellular backhaul and mobile wireless), satellite networks (teleport and VSAT), power systems (generators, commercial power and battery systems), facilities management, and software/firmware. Programming techniques and examples for simulation of the approaches presented are discussed throughout the book. This powerful resource: Acts as a comprehensive reference and textbook for analysis and design of highly reliable and available telecommunications systems Bridges the fields of system reliability theory, telecommunications system engineering, and computer programming Translates abstract reliability theory concepts into practical tools and techniques for technical managers, engineers and students Provides telecommunication engineers with a holistic understanding of system reliability theory, telecommunications system engineering, and reliability/risk analysis Telecommunications System Reliability Engineering, Theory, and Practice is a must-have guide for telecommunications engineers or engineering students planning to work in the field of telecommunications Telecommunications System Reliability Engineering, Theory, and Practice is a must-have guide for telecommunications engineers or engineering students planning to work in the field of telecommunications.
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming «test and try out» method to obtain the best solution. Modeling and simulation can easily ensure virtual Design of Experiments (DoE) to achieve the optimal solution. This has greatly reduced the cost and production time, especially for new product development. Using modeling and simulation will become increasingly necessary for future advances in 3D package development. In this book, Liu and Liu allow people in the area to learn the basic and advanced modeling and simulation skills to help solve problems they encounter. Models and simulates numerous processes in manufacturing, reliability and testing for the first time Provides the skills necessary for virtual prototyping and virtual reliability qualification and testing Demonstrates concurrent engineering and co-design approaches for advanced engineering design of microelectronic products Covers packaging and assembly for typical ICs, optoelectronics, MEMS, 2D/3D SiP, and nano interconnects Appendix and color images available for download from the book's companion website Liu and Liu have optimized the book for practicing engineers, researchers, and post-graduates in microelectronic packaging and interconnection design, assembly manufacturing, electronic reliability/quality, and semiconductor materials. Product managers, application engineers, sales and marketing staff, who need to explain to customers how the assembly manufacturing, reliability and testing will impact their products, will also find this book a critical resource. Appendix and color version of selected figures can be found at www.wiley.com/go/liu/packaging
A comprehensively updated and reorganized new edition. The updates include comparative methods for improving reliability; methods for optimal allocation of limited resources to achieve a maximum risk reduction; methods for improving reliability at no extra cost and building reliability networks for engineering systems. Includes: A unique set of 46 generic principles for reducing technical risk Monte Carlo simulation algorithms for improving reliability and reducing risk Methods for setting reliability requirements based on the cost of failure New reliability measures based on a minimal separation of random events on a time interval Overstress reliability integral for determining the time to failure caused by overstress failure modes A powerful equation for determining the probability of failure controlled by defects in loaded components with complex shape Comparative methods for improving reliability which do not require reliability data Optimal allocation of limited resources to achieve a maximum risk reduction Improving system reliability based solely on a permutation of interchangeable components
This book presents fundamentals of reliability engineering with its applications in evaluating reliability of multistage interconnection networks. In the first part of the book, it introduces the concept of reliability engineering, elements of probability theory, probability distributions, availability and data analysis. The second part of the book provides an overview of parallel/distributed computing, network design considerations, and more. The book covers a comprehensive reliability engineering methods and its practical aspects in the interconnection network systems. Students, engineers, researchers, managers will find this book as a valuable reference source.
The aerospace community has long recognized and repeatedly emphasizes the importance of reliability for space systems. Despite this, little has been published in book form on the topic. Spacecraft Reliability and Multi-state Failures addresses this gap in the literature, offering a unique focus on spacecraft reliability based on extensive statistical analysis of system and subsystem anomalies and failures. The authors provide new results pertaining to spacecraft reliability based on extensive statistical analysis of on-orbit anomaly and failure data that will be particularly useful to spacecraft manufacturers and designers, for example in guiding satellite (and subsystem) test and screening programs and providing an empirical basis for subsystem redundancy and reliability growth plans. The authors develop nonparametric results and parametric models of spacecraft and spacecraft subsystem reliability and multi-state failures, quantify the relative contribution of each subsystem to the failure of the satellites thus identifying the subsystems that drive spacecraft unreliability, and propose advanced stochastic modeling and analysis tools for the reliability and survivability of spacecraft and space-based networks. Spacecraft Reliability and Multi-state Failures provides new nonparametric results pertaining to spacecraft reliability based on extensive statistical analysis of on-orbit anomaly and failure data; develops parametric models of spacecraft and spacecraft subsystem reliability and multi-state failures quantifies the relative contribution of each subsystem to the failure of the satellites proposes advanced stochastic modeling and analysis tools for the reliability and survivability of spacecraft and space-based networks. provides a dedicated treatment of the reliability and subsystem anomalies of communication spacecraft in geostationary orbit.
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